Publications and Conference Presentations by David C. Trindade, Ph.D.

Texts

Applied Reliability, 3rd ed., co-authored with Dr. Paul Tobias, 2012, Chapman &Hall/ CRC

Design of Experiments, An Overview for Managers, 1991, Council for Continuous Improvement (CCI)

“Field Data Analysis for Repairable Systems: Status and Industry Trends”, co-authored with Swami Nathan in Handbook of Performability Engineering, K.B. Misra (ed.), 2008, Springer

Technical Publications and Reports

(Links to many public articles are provided. Click on year to view.)

"FET CPI, CPF and FSU Reliability Models," 1974, IBM Technical Report TR 19.0327

"Propagation of Error in Accelerated Stressing," 1975, IBM Technical Report, TR 19.0353

"Mathematical Development of an Empirical Gate Short Model," 1975, IBM Technical Report TR 19.0345

"An APL Program to Numerically Differentiate Data by the Ruler Method,"  1975, IBM Technical Report TR 19.0361

"Simulating Reliability Distributions in APL," 1978, IBM TR 19.0451

"An APL Solution to a Tridiagonal System of Linear Equations," 1978, IBM Technical Report, TR190456

"Nonparametric Estimation of a Lifetime Distribution via the Renewal Function," 1979, co-authored with Dr. Larry Haugh, IBM Technical       Report TR 19.0463

"Estimation of the Reliability of Computer Components from Field Renewal Data," 1979, co-authored with Dr. Larry Haugh, IBM Technical Report, TR19.0488

"Two APL Programs for the Gehan-Wilcoxon Test to Nonparametrically Compare Censored Reliability Data," 1979, IBM TR 19.0480

"Simulating Reliability Distributions in APL," 1980, Proceedings of the American Institute for Decision Sciences

"Estimation of the reliability of computer components from field renewal data," 1980, Microelectronics and Reliability, co-authored with Dr. Larry Haugh

Reliability, 1986, Advanced Micro Devices Quality and Reliability Brochure

Reliability, 1987, Advanced Micro Devices Quality and Reliability Brochure

"The Successful Road to SPC- Avoiding the Potholes," 1989, Proceedings of the Technical Program, National Electronic Packaging and    Production Conference (NEPCON)

"Can Burn-In Screen Wearout Mechanisms? Reliability Modeling of Defective Subpopulations - A Case Study," 1991, 29th Annual   Proceedings of the Reliability Physics Symposium

There are also more than thirty publications for IBM, GI, AMD, and SUN internal technical and statistical conferences. The topics have included reliability models, renewal processes, minimum size sampling plans, regression analysis of covariance, EVOP, split-plot designs, and other statistical techniques.  In addition, externally there have been eleven presentations at ASA Annual meetings and over twenty-five papers presented at various other external conferences, such as ASQC, IRPS, NEPCON, SEMICON, SEMATECH Workshops, INFORMS, 7x24 Exchange, and CCI.  Recent examples are listed below.

Conference Presentations and Tutorials

"Nonparametric Estimation of a Reliability Function in Multicensored Life Testing with Unidentified Replacement of Failed Items," co-authored with Dr. Larry Haugh, American Statistical Association Annual Joint Meetings, 1976, Boston

"Nonparametric Estimation of a Lifetime Distribution Via the Renewal Function," co-authored with Dr. Larry Haugh, American Statistical Association Annual Joint Meetings, 1977, Chicago

"Standard Error of Nonparametric Estimators of Lifetime Distributions with Renewal Data," co-authored with Dr. Larry Haugh, American Statistical Association Annual Joint Meetings, 1978, San Diego

"Nonparametric Estimation of Component Reliability: An Application to Field Renewal Data," co-authored with Dr. Larry Haugh, American Statistical Association Annual Joint Meetings, 1979, Washington, D.C.

The Sphere of Excellence, 1983, General Instrument Quality and Reliability Brochure

“Arrow Charts: A New Way of Displaying Multiple Comparison Data” American Statistical Association Annual Joint Meetings, 1993, San Francisco

“The Reverse Arrangement Test: A Simple Procedure for Detecting Trends in Repairable System Reliability,” SEMATECH 1995 Applied Reliability Tools Workshop (ARTWORK VIII) in Boston

“Survey Data: Use of Scatter Plots for Displaying Scale and Consistency Factors” American Statistical Association Annual Joint Meetings, 1995, Orlando

“Multivariate Process Control with Radar Charts,” SEMATECH 1996 Statistical Methods Symposium on Multivariate Methods in the Semiconductor Industry in San Antonio

“Computer Simulation of Repairable Processes,” SEMATECH 1996 Applied Reliability Tools Workshop (ARTWORK IX) in Santa Fe

“Components of Variance and Nested Factorial Designs,” First International Metrology Conference, 1996, Honolulu

“Confirming Trends in Repairable Systems,” American Statistical Association Annual Joint Meetings, 1996, Chicago

“An Overview of Applied Reliability,” Council for Continuous Improvement (CCI) General Session, 1996, Oakland

“Regression Models for a Binary Response Using EXCEL and JMP,” SEMATECH Statistical Methods Group Symposium, 1997, Austin, TX

“An Introduction to Logistic Regression,” American Society of Quality, Santa Clara Chapter, 1997

“Making Sense of Data: Excel Analysis Tools (A Tutorial)”, Council for Continuous Improvement General Session, April 1997, San Jose, CA

“A General EXCEL Solution for LTPD Type Sampling Plans,” American Statistical Association Annual Joint Meetings, with David Meade,1999, Baltimore

“The Importance of Understanding Variation in Software Metrics,” 1999, ASQ 9th Software Quality Conference, Boston

“An EXCEL Add-In for Comparing Two Exponential Distributions,” American Statistical Association Annual Joint Meetings, with David Meade, 2000, Indianapolis

“Reliability and Availability Modeling of Repairable Systems,” 2000, Sun Technology Leadership Conference, Santa Clara, CA

“An EXCEL Add-In for Capturing Simulation Statistics,” American Statistical Association Annual Joint Meetings, with David Meade, 2001, Atlanta

“Reliability IS Time Dependent,” 2002, Sun Technology Leadership Conference, Santa Clara, CA

“Simple Plots for Monitoring the Field Reliability of Repairable Systems”, Co-author with S, Nathan, RAMS, January 2005, Alexandria, VA

"Failure Rate: Which One?", Test@Sun Conference, April 2005, Newark, CA

“Simple Plots for Monitoring Field Reliability”, Co-author with S, Nathan, Applied Reliability Symposium, 2005, San Diego, CA

"Failure Rate: Which One?", International SEMATECH Manufacturing Initiative (ISMI), October 2005, Austin, TX

"Modeling High Availability Systems", Co-author with K. Trivedi, R. Vasireddy, S. Nathan, R. Castro, PRCD'06 Conference, 2006, Riverside, CA

“Analysis of Field Data for Repairable Systems”, Co-author with S, Nathan, Tutorial, RAMS, 2006, Orlando, FL

“Analysis of Field Data for Repairable Systems”, 7x24 Exchange Conference, October 2006, Scottsdale, AZ

“Analysis of Field Data for Repairable Systems”, Tutorial, Co-author with S, Nathan, RAMS, 2007, Newport Beach, CA

“Common Statistical Questions in Test Planning”, Test@Sun Conference, May 2007, Menlo Park, CA

“Availability and Cost Monitoring in Datacenters Using Mean Cumulative Functions”, Joint Statistical Meetings, 2007, Salt Lake City

“Warranty Analysis of Repairable Systems”, Co-author with J. Glosup, B. Heavlin, Quality and Productivity Research Conference, June 2007, Santa Fe, NM

“Analysis of the Field Reliability of Repairable Systems”, INFORMS, July 2007, Puerto Rico

“How Reliable Are Sun Systems at My Customers’ Data Centers?” Sun Customer Engineering Conference (CEC), October 2007, Las Vegas

“Analysis of Field Data for Repairable Systems”, Tutorial, Co-author with S, Nathan, RAMS, 2008, Las Vegas, NV

“The Many Forms of Reliability Data”, Joint Statistical Meetings Roundtable, August 2008, Denver, CO